| Course Unit Code | Course Unit Title | Type of Course Unit | Year of Study | Semester | Number of ECTS Credits | | MM245 | Material Characterization Techniques | Elective | 1 | 1 | 6 |
|
| Level of Course Unit |
| Second Cycle |
| Objectives of the Course |
| To understand how to use data in material characterization by learning the basic principles of microscopic (optical and electron), thermal, diffraction and spectroscopic methods. |
| Name of Lecturer(s) |
| Dr. Öğr. Üyesi Erdal İĞMAN |
| Learning Outcomes |
| 1 | Understands the necessity, basic principles and classification of material characterization. | | 2 | Learns the structure, components and imaging modes of the optical microscope. | | 3 | Understands the difference between optical and electron microscopes. | | 4 | Knows how to analyze the crystal structure by learning the interaction of X-rays with matter. | | 5 | Understands which spectroscopic method to use to learn the structural properties of the material. |
|
| Mode of Delivery |
| Normal Education |
| Prerequisites and co-requisities |
| None |
| Recommended Optional Programme Components |
| None |
| Course Contents |
| Introduction to material characterization and classification of characterization methods, Microscopic methods; Optical microscope, Scanning electron microscope (SEM), Transmission electron microscope (TEM) and their working principles. Comparison of microscopic methods. X-ray diffraction (XRD) method; Qualitative and Quantitative Analysis Methods (XRF, EDX and WDX). Thermal analysis methods (TG, DTA, DSC). Spectroscopic methods; Fourier transform optical measurements (FTIR), RAMAN Spectroscopy and UV-VIS Spectroscopy. |
| Weekly Detailed Course Contents |
|
| 1 | Introduction to materials characterization | None | None | | 2 | Classification of material characterization methods | None | None | | 3 | Structure and features of the optical microscope | None | None | | 4 | Optical microscope imaging modes | None | None | | 5 | Scanning electron microscope (SEM) and its working principle | None | None | | 6 | Transmission electron microscope (TEM) and its working principle | None | None | | 7 | Electron microscope imaging, analysis and comparison | None | None | | 8 | Midterm | None | None | | 9 | Properties and production of X-rays | None | None | | 10 | Interaction of X-rays with matter and X-ray diffraction (XRD) | None | None | | 11 | Qualitative and Quantitative Analysis Methods (XRF, EDX and WDX) | None | None | | 12 | Thermal analysis methods | None | None | | 13 | Spectroscopic methods; UV-VIS Spectroscopy | None | None | | 14 | Fourier Transform Infrared Spectroscopy (FTIR) | None | None | | 15 | Raman Spectroscopy | None | None |
|
| Recommended or Required Reading |
| MODERN FİZİK TAKVİYELİ MALZEME KARAKTERİZASYONU ve TEMEL İLKELERİ Prof.Dr. Z. Engin ERKMEN |
| Planned Learning Activities and Teaching Methods |
|
| Assessment Methods and Criteria | |
| Midterm Examination | 1 | 100 | | SUM | 100 | |
| Final Examination | 1 | 100 | | SUM | 100 | | Term (or Year) Learning Activities | 40 | | End Of Term (or Year) Learning Activities | 60 | | SUM | 100 |
| | Language of Instruction | | Turkish | | Work Placement(s) | | None |
|
| Workload Calculation |
|
| Midterm Examination | 1 | 1 | 1 |
| Final Examination | 1 | 2 | 2 |
| Attending Lectures | 14 | 3 | 42 |
| Problem Solving | 14 | 2 | 28 |
| Self Study | 14 | 3 | 42 |
| Individual Study for Mid term Examination | 1 | 10 | 10 |
| Individual Study for Final Examination | 1 | 20 | 20 |
| Homework | 14 | 2 | 28 |
|
| Contribution of Learning Outcomes to Programme Outcomes |
| LO1 | 3 | 2 | 2 | 3 | 3 | 2 | | LO2 | 3 | 2 | 2 | 3 | 2 | 2 | | LO3 | 4 | 2 | 2 | 3 | 3 | 3 | | LO4 | 4 | 2 | 3 | 2 | 3 | 3 | | LO5 | 4 | 2 | 3 | 3 | 3 | 3 |
|
| * Contribution Level : 1 Very low 2 Low 3 Medium 4 High 5 Very High |
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